E-passport sensitive to stamping or writing

The introduction of European digital passports will facilitate fully automated, secure and convenient (walk-through) border passage. As part of the EC-supported Digital Passport STREP project (headed by Infineon Technologies) a new generation of digital passport is being developed and manufactured. This article contains the full report of Jürgen von Stebut’s study into the threshold stress values for various widely accepted e-passport testing methods.